During semiconductor device fabrication, thin film growth and deposition steps typically occur more number of times than any other process. These are often critical processes that require careful thickness and quality control. For example, during silicon (Si) transistor fabrication, growth of a thin film of silicon dioxide (SiO2) is generally required immediately after the RCA clean process. This oxide can be grown on the Si wafer surface using different processes that define its growth rate and quality. Whatever the chosen process, maintaining tight control of process conditions and minimizing contamination on the Si wafer surface during the growth process is critical for final device performance. Hence, separate process-based oxide growth furnaces are needed for the same.
Thin film depositions of other materials are also needed at various stages of device fabrication – from the initial active semiconducting layers to the final metal contact layers. With new materials being explored for various applications today, dedicated systems and novel deposition techniques are required to integrate them into devices. Pulsed laser deposition (PLD) and atomic layer deposition (ALD) are two examples of such enabling capabilities available at IITBNF, along with conventional silicon processing equipment. Conventional metal and insulator deposition tools, along with dedicated anneal systems, complete the expansive gamut of deposition capabilities at IITBNF for introducing new materials onto the silicon platform and fabricating new device structures.
The following list includes dedicated growth, deposition and anneal systems for 2”, 4” and 8” silicon wafers at IITBNF; along with separate tools for other substrate materials and sizes. Implantation tools are also included in the list since they are used in conjunction with anneal systems.
# | Instrument | Location | Contamination category |
---|---|---|---|
1 | Inductively coupled plasma CVD (ICPCVD) | Nano Lab | semi clean b |
2 | Rapid Thermal Processing_Nano lab_General | Nano Lab | gold contaminated |
3 | Hot wire CVD(HWCVD) | Micro2 Lab | gold contaminated |
4 | Organic Evaporation System | Micro2 Lab | gold contaminated |
5 | Ultech Furnace Dry Oxide | Nano Lab | clean |
6 | 2 inch General purpose Forming gas(FGA)/ Ar /N2 annealing furnace | Micro1 Lab | gold contaminated |
7 | 2 inch Boron_Solid source Diffusion Furnace | Micro1 Lab | clean |
8 | 2 inch CMOS specific FGA furnace | Micro1 Lab | semi clean b |
9 | Rapid Thermal Processing Group IV (RTP Grp-IV) | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | semi clean b |
10 | 2 inch Dry oxidation Furnace | Micro1 Lab | clean |
11 | 2 inch Wet oxidation Furnace | Micro1 Lab | clean |
12 | 2 inch N2 Annealing Furnace | Micro1 Lab | clean |
13 | 2 inch Phosphorous_Solid source Diffusion Furnace | Micro1 Lab | clean |
14 | 4 target E-beam evaporator | Micro1 Lab | gold contaminated |
15 | Dielectric - sputter System | Micro1 Lab | gold contaminated |
16 | Thermal Evaporator - Al | Micro1 Lab | gold contaminated |
17 | Thermal Evaporator-Cr/Au | Micro1 Lab | gold contaminated |
18 | PLD I | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | gold contaminated |
19 | PLD II | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | clean |
20 | 6 Target E Beam Evaporator | MBE Clean Room 2 (NanoE bldg, Gr floor) | gold contaminated |
21 | PLD target making furnace | EC Lab | clean |
22 | Electro Plating system (Cu) | EC Lab | semi-clean pv |
23 | Molecular Beam Epitaxy III-V | MBE Clean Room 1 (NanoE bldg, Gr floor) | clean (III,V compounds) |
24 | In Thermal Evaporator | MBE Clean Room 2 (NanoE bldg, Gr floor) | gold contaminated |
25 | Ultech Furnace Silicon Oxynitride (SiON) | Nano Lab | clean |
26 | Ultech Furnace Pyrogenic Oxide | Nano Lab | clean |
27 | Ultech Furnace Low Temperature Oxide (LTO) | Nano Lab | clean |
28 | Ultech Furnace Silicon Nitride (SiN) | Nano Lab | clean |
29 | Ultech Furnace Drive In | Nano Lab | clean |
30 | Ultech Furnace i-poly | Nano Lab | gold contaminated |
31 | Ultech Furnace Anneal | Nano Lab | clean |
32 | Ultech Furnace n-doped poly | Nano Lab | clean |
33 | Sputter ATC 2200 | Nano Lab | semi clean b |
34 | Sputter Orion | Nano Lab | gold contaminated |
35 | ALD (Non LL) | Nano Lab | semi clean b |
36 | ALD LL | Nano Lab | semi clean b |
37 | Electroplating system - Au/Ni/Cu | EC Lab | gold contaminated |
38 | Multi-pocket Electron-beam Evaporator (4 target - GaN) | Micro1 Yellow Room | gold contaminated |
39 | Sputter NMPF | Nano 2 Lab | gold contaminated |
40 | Parylene CVD – SCS | Micro1 Lab | gold contaminated |
41 | LPCVD Furnace_SixNy | NMPF Lab | clean |
42 | LPCVD Furnace_PolySi Doped PolySi | NMPF Lab | clean |
43 | LPCVD Furnace_Thermal oxidation | NMPF Lab | clean |
44 | Rapid Thermal Process_NMPF Lab_General | Nano 2 Lab | gold contaminated |
45 | Plasma Doping System | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | semi clean b |
46 | Molecular Beam Epitaxy III Nitrides | MBE Clean Room 1 (NanoE bldg, Gr floor) | semi clean a |
47 | Molecular Beam Epitaxy Si Ge Sn | MBE Clean Room 1 (NanoE bldg, Gr floor) | clean |
48 | Gold Electroplating System | Micro1 Lab | clean |
49 | PLD III | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | clean |
50 | PLD IV | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | clean |
51 | Hot plate with stirrer (1)_Fume Hood 1 | 7.1 Lab | tbd |
52 | Hot plate with stirrer (2)_Fume Hood 1 | 7.1 Lab | tbd |
53 | 2 inch general purpose annealing furnace_Fume hood 3 | 7.1 Lab | off line a |
54 | Dip Coater | 7.1 Lab | gold contaminated |
55 | Hot plate with stirrer (3)_2 arm glove box | 7.1 Lab | tbd |
56 | Hot plate with stirrer (4)_4-arm glove box | 7.1 Lab | tbd |
57 | Schlenk Line (2)_Fume Hood 3 | 7.1 Lab | gold contaminated |
58 | Atmospheric Furnace_7.1 Lab | 7.1 Lab | tbd |
59 | Drying Oven_7.1 Lab | 7.1 Lab | tbd |
60 | Tube Furnace_Fume hood 5 | 7.1 Lab | tbd |
61 | AJA 6 Target E beam Evaporator | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | gold contaminated |
62 | pH Meter | 7.1 Lab | clean |
63 | Spin Coater_4 arm glove box | 7.1 Lab | clean |
64 | SILAR controller | 7.1 Lab | clean |
65 | Thermogravimetric Analyzer | 7.1 Lab | clean |
66 | Hydrothermal Reactor_Fume Hood 2 | 7.1 Lab | clean |
67 | Fume Hood 4 | 7.1 Lab | clean |
68 | Laser 2_4 | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | clean |
69 | Eppendorf FemtoJet 4x Microinjector | Bio Sensors Lab (NanoE bldg, 7th floor) | clean |
70 | Laser 1_3 | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | clean |
71 | Magneto Optic Kerr Effect (MOKE) | Spintronics Lab | clean |
72 | Magnetoresistance Setup | Applied Quantum Mechanics Lab 2(NanoE bldg, 5th floor) | clean |
73 | Magnetoresistance Setup with Vector Network Anlyser (VNA) and Rotating stage | Spintronics Lab | clean |
74 | 2D Materials CVD | 2D Materials and Devices Lab | clean |
75 | Rapid Thermal Processing GaN (RTP GaN) | Nanoelectronics Processing Lab (NanoE bldg, 1st floor) | gold contaminated |
76 | Raith Voyager | 2D Materials and Devices Lab | clean |
77 | DI Water Plant | NMPF Lab | clean |
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To understand what the contamination categories mean, click here |
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To check if your process plan complies with contamination rules, click here |
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To view current working status of all the instruments, click here |