FPA (Focal Plane Array) Characterization set up
| Name of the Equipment | FPA (Focal Plane Array) Characterization set up |
| Category | litho/analytical |
| Operator | |
| System Owner | |
| Short Name | |
| Make/ Model | NA/ NA |
| Critical Tool | No |
| Serial Number | NA |
| FootPrint | NA |
| InstallationDate | |
| Equipment Type | Electrical characterization tools |
| Location | Applied Quantum Mechanics Lab 3(NanoE bldg, 5th floor) |
| AMC | Required |
| Local Dealer | NA NA |
| Actual Dealer | NA NA |
| Training & other policy documents | POLICY/111_POLICY.pdf |
| Recipe List | |
| Glimpse | GLIMPSE/111_Glimpse.pdf |
| Tool Facilities Requirements | |
| Access | Open |
| Lab Phone No | |
| Substrate allowed | GaAs/ III-V compounds |
| Substrate Dimension | 12 x 12 mm |
| Chemical allowed | NA, III-V materials |
| Precursors/ Targets allowed *Based on stock availability | NA |
| Precursor/ Target loaded inside tool | |
| Target dimension | NA |
| Gases allowed | NA |
| Contamination remarks | NA |