4 probe Measurement (Automatic)
| Name of the Equipment | 4 probe Measurement (Automatic) |
| Category | litho/analytical |
| Operator | Shraddha Thakur Shahiroze Khetani Minita Surwade |
| System Owner | Shilpa Kharat 30003402@iitb.ac.in Karuna Nyaupane 30005949@iitb.ac.in |
| Short Name | |
| Make/ Model | 4D/ 280TSI |
| Critical Tool | No |
| Serial Number | 060918 |
| FootPrint | 5 X 3 feet |
| InstallationDate | 07/03/2006 |
| Equipment Type | Electrical characterization tools |
| Location | Micro2 Lab |
| AMC | Required |
| Local Dealer | NA NA |
| Actual Dealer | Kent Wang Kent Wang Email:kent@4dimensions.com |
| Training & other policy documents | POLICY/140_POLICY.pdf |
| Recipe List | RECEPIES/140_RECEPIES.pdf |
| Glimpse | GLIMPSE/140_GLIMPSE.pdf |
| Tool Facilities Requirements | Vacuum Pump |
| Access | Open |
| Lab Phone No | Analytical |
| Substrate allowed | Any substrate (material should not be sticky and should adhere to the substrate) |
| Substrate Dimension | min 1cm x 1cm. height should not exceed 2mm |
| Chemical allowed | NA, Sticky and soft samples are not allowed, Samples containing Na, K may require permission |
| Precursors/ Targets allowed *Based on stock availability | NA |
| Precursor/ Target loaded inside tool | |
| Target dimension | NA |
| Gases allowed | NA |
| Contamination remarks | Samples should not cotain any visible dust and should be properly stick to the base substrate |